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T. Aggerstam

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2000 – 2009

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2009
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Thorvald G. Andersson, X. Y. Liu, T. Aggerstam, Petter Holmström, S. Lourdudoss, Lars Thylén, Y. L. Chen, C. H. Hsieh, I. Lo:
Macroscopic defects in GaN/AlN multiple quantum well structures grown by MBE on GaN templates. Microelectron. J. 40(2): 360-362 (2009)

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