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Salem Abdennadher
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2020 – today
- 2023
- [c11]Salem Abdennadher:
High-Speed IO IP Process Technology & Design Interactions: Problems & Solutions. DTTIS 2023: 1-6 - [e1]Salem Abdennadher, Mohamed Masmoudi:
2023 IEEE International Conference on Design, Test and Technology of Integrated Systems, DTTIS 2023, Gammarth, Tunisia, November 1-4, 2023. IEEE 2023, ISBN 979-8-3503-1696-4 [contents] - 2020
- [c10]Salem Abdennadher, Kyle Tripician, Senthil Singaravelu:
At Speed Testing Challenges and Solutions for 56Gbps and 112Gbps PAM4 SerDes. LATS 2020: 1-5
2010 – 2019
- 2019
- [c9]Salem Abdennadher, Arani Sinha, Yonghyun Kim:
Analog/Mixed Signal IP DFx from a Foundry perspective. LATS 2019: 1-4 - 2018
- [c8]Horaira Abu, Salem Abdennadher, Benoit Provost, Harry Muljono:
Augmenting ESD and EOS physical analysis with per pin ESD and leakage DFT. ISQED 2018: 20-24 - [c7]Salem Abdennadher, Michael Altmann, Bin Xue:
Challenges and emerging solutions in testing HBM IO & systems. LATS 2018: 1-4 - 2016
- [c6]Salem Abdennadher, Saghir A. Shaikh:
Practices in High-Speed IO testing. ETS 2016: 1-8 - 2012
- [c5]Anne Meixner, Salem Abdennadher:
Improving IO test and system evaluation via data sharing. DTIS 2012: 1-6
2000 – 2009
- 2008
- [c4]Salem Abdennadher:
Effects of Advances in Analog, Mixed Signal and IO Circuits on Test Strategies. ATS 2008: 145 - 2007
- [j1]Salem Abdennadher, Saghir A. Shaikh:
Practices in Mixed-Signal and RF IC Testing. IEEE Des. Test Comput. 24(4): 332-339 (2007) - 2005
- [c3]Salem Abdennadher, Saghir A. Shaikh:
Practices in Testing of Mixed-Signal and RF SoCs. Asian Test Symposium 2005: 467 - [c2]Salem Abdennadher, Saghir A. Shaikh:
Challenges in High Speed Interface Testing. Asian Test Symposium 2005: 468
1990 – 1999
- 1993
- [c1]Sayfe Kiaei, Salem Abdennadher, Gabor C. Temes, Yaohua Yang:
Adaptive Digital Correction for Dual Quantization Sigma-Delta Modulators. ISCAS 1993: 1228-1230
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