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2020 – today
- 2020
[j4]Pinghe Ni, Jun Li, Hong Hao, Weimin Yan, Xiuli Du, Hongyuan Zhou:
Reliability analysis and design optimization of nonlinear structures. Reliab. Eng. Syst. Saf. 198: 106860 (2020)
2010 – 2019
- 2019
- [j3]Zhenghao Ding, Jun Li
, Hong Hao, Zhong-Rong Lu:
Nonlinear hysteretic parameter identification using an improved tree-seed algorithm. Swarm Evol. Comput. 46: 69-83 (2019) - 2017
- [j2]Zhilou Yu, Hong Hao, Weipin Zhang, Hongjun Dai:
A Classifier Chain Algorithm with K-means for Multi-label Classification on Clouds. J. Signal Process. Syst. 86(2-3): 337-346 (2017) - 2016
- [c11]Andreas Nautsch, Hong Hao, Themos Stafylakis, Christian Rathgeb, Christoph Busch:
Towards PLDA-RBM based speaker recognition in mobile environment: Designing stacked/deep PLDA-RBM systems. ICASSP 2016: 5055-5059 - [c10]Andrzej J. Strojwas, Jacob A. Abraham, Hong Hao, Max M. Shulaker:
Keynote address: Challenges and opportunities in electrical characterization and test for 14nm and below. VTS 2016: 1-2 - 2011
- [c9]Haitao Che, Shijie Zhuang, Lianbo Jiang, Hong Hao, Hongbing Zhang:
Design of wireless transmission digital thermometer. ICCC 2011: 13-16 - [c8]Haijiang Chen, Lianbo Jiang, Hong Hao, Hongbing Zhang:
The modeling and controlling of smart car motor based on laser sensor. ICCC 2011: 17-19 - [c7]Qiuleji, Lianbo Jiang, Hong Hao, Hongbing Zhang:
The smart car based on laser control. ICCC 2011: 88-91
1990 – 1999
- 1998
- [c6]Young-Jun Kwon, Ben Mathew, Hong Hao:
FakeFault: a silicon debug software tool for microprocessor embedded memory arrays. ITC 1998: 727-732 - 1997
- [c5]Magdy S. Abadir, Jacob A. Abraham, Hong Hao, C. Hunter, Wayne M. Needham, Ron G. Walther:
Microprocessor Test and Validation: Any New Avenues? VTS 1997: 458-464 - 1995
- [c4]Hong Hao, Kanti Bhabuthmal:
Clock controller design in SuperSPARC II microprocessor. ICCD 1995: 124-129 - [c3]Hong Hao, Rick Avra:
Structured Design-for-Debug - The SuperSPARCTM II Methodology and Implementation. ITC 1995: 175-183 - 1993
- [j1]Hong Hao, Edward J. McCluskey:
Analysis of Gate Oxide Shorts in CMOS Circuits. IEEE Trans. Computers 42(12): 1510-1516 (1993) - [c2]Hong Hao, Edward J. McCluskey:
Very-Low-Voltage Testing for Weak CMOS Logic ICs. ITC 1993: 275-284 - 1991
- [c1]Hong Hao, Edward J. McCluskey:
"Resistive Shorts" Within CMOS Gates. ITC 1991: 292-301
Coauthor Index
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