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Rachid Bouchakour
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2020 – today
- 2022
- [j4]Yajian Gan, Wenceslas Rahajandraibe, Remy Vauche, Blaise Ravelo, Nominoë Lorriere, Rachid Bouchakour:
A new method to reduce motion artifact in electrocardiogram based on an innovative skin-electrode impedance model. Biomed. Signal Process. Control. 76: 103640 (2022) - 2020
- [c17]Remy Vauche, Zineb Benjelloun, Rym Assila Belhadj Mefteh, Wenceslas Rahajandraibe, Rachid Bouchakour, Hervé Barthélemy:
Design and Analysis of a Gilbert Analog Multiplier for Input Dynamic Range optimization. DTIS 2020: 1-6
2010 – 2019
- 2018
- [c16]Bruno Lawson, Khalifa Aguir, Zouhair Haddi, Tomas Fiorido, Rachid Bouchakour, Marc Bendahan:
Toward a Selective Detection of Ethanol by Perspiration. IEEE SENSORS 2018: 1-4 - 2017
- [c15]Zouhair Haddi, Jean-François Pons, Stéphane Delliaux, Bouchra Ananou, Jean-Claude Deharo, Ahmed Charaï, Rachid Bouchakour, Mustapha Ouladsine:
A Robust Detection Method of Short Atrial Fibrillation Episodes. CinC 2017 - 2016
- [c14]Zineb Benjelloun, Rémy Vauché, Wenceslas Rahajandraibe, Rachid Bouchakour:
Design of an energy detector for heartbeat localization in ECG signals. ICECS 2016: 73-76 - 2013
- [c13]Abderrezak Marzaki, V. Bidal, Romain Laffont, Wenceslas Rahajandraibe, Jean-Michel Portal, Rachid Bouchakour:
DCG-FGT transistor: Retention study of Floating Gate charge. MWSCAS 2013: 825-827 - 2012
- [c12]Abderrezak Marzaki, V. Bidal, Romain Laffont, Wenceslas Rahajandraibe, Jean-Michel Portal, Rachid Bouchakour:
PSP based DCG-FGT transistor Model: Full characterization procedure. ISCIT 2012: 222-227 - [c11]Abderrezak Marzaki, V. Bidal, Romain Laffont, Wenceslas Rahajandraibe, Jean-Michel Portal, Rachid Bouchakour:
A new adustable Schmitt Trigger based on Dual Control Gate-Floating Gate Transistor (DCG-FGT). MWSCAS 2012: 643-645 - 2011
- [c10]Emmanuel Hardy, Hassan Ihs, Christian Dufaza, Stéphane Meillére, Rachid Bouchakour:
A partial tree vector quantizer dynamic element matching technique for audio Δ-Σ converters. CICC 2011: 1-4 - [c9]Abderrezak Marzaki, V. Bidal, Romain Laffont, Wenceslas Rahajandraibe, Jean-Michel Portal, Rachid Bouchakour:
PSP based DCG-FGT transistor model including characterization procedure. ICECS 2011: 228-231
2000 – 2009
- 2009
- [j3]Jérémy Postel-Pellerin, Frédéric Lalande, Pierre Canet, Rachid Bouchakour, F. Jeuland, B. Bertello, B. Villard:
Extraction of 3D parasitic capacitances in 90 nm and 22 nm NAND flash memories. Microelectron. Reliab. 49(9-11): 1056-1059 (2009) - [j2]Jérémy Postel-Pellerin, Frédéric Lalande, Pierre Canet, Rachid Bouchakour, F. Jeuland, L. Morancho:
Modeling charge variation during data retention of MLC Flash memories. Microelectron. Reliab. 49(9-11): 1060-1063 (2009) - [c8]Fayrouz Haddad, Wenceslas Rahajandraibe, Lakhdar Zaïd, Oussama Frioui, Rachid Bouchakour:
Radio frequency tunable polyphase filter design. ICECS 2009: 21-24 - 2007
- [c7]Fayrouz Haddad, Rachid Bouchakour, Wenceslas Rahajandraibe, Lakhdar Zaïd, Oussama Frioui:
Radio Frequency Polyphase Filter Design in 0.13-μm CMOS for Wireless Communications. ICECS 2007: 833-836 - 2006
- [c6]B. Saillet, Arnaud Régnier, Jean-Michel Portal, B. Delsuc, Romain Laffont, Pascal Masson, Rachid Bouchakour:
MM11 based flash memory cell model including characterization procedure. ISCAS 2006 - 2005
- [j1]Fabien Gilibert, Denis Rideau, Alexandre Dray, Francois Agut, Michel Minondo, Andre Juge, Pascal Masson, Rachid Bouchakour:
Characterization and Modeling of Gate-Induced-Drain-Leakage. IEICE Trans. Electron. 88-C(5): 829-837 (2005) - 2002
- [c5]Romain Laffont, J. Razafindramora, Pierre Canet, Rachid Bouchakour, Jean-Michel Mirabel:
Decreasing EEPROM Programming Bias With Negative Voltage, Reliability Impact. MTDT 2002: 168-176 - 2001
- [c4]Rachid Bouchakour, Nadia Harabech, Pierre Canet, Philippe Boivin, Jean Michel Mirable:
Modeling of a floating-gate EEPROM cell using a charge sheet approach including variable tunneling capacitance and polysilicon gate depletion effect. ISCAS (4) 2001: 822-825 - [c3]Pierre Canet, Rachid Bouchakour, Nadia Harabech, Philippe Boivin, Jean-Michel Mirabel:
EEPROM programming study-time and degradation aspects. ISCAS (4) 2001: 846-849 - 2000
- [c2]Nadia Harabech, Rachid Bouchakour, Pierre Canet, Philippe Pannier, Jean-Pierre Sorbier:
Extraction of Fowler-Nordheim parameters of thin SiO2 oxide film including polysilicon gate depletion: validation with an EEPROM memory cell. ISCAS 2000: 441-444
1990 – 1999
- 1998
- [c1]Hector Recoules, Rachid Bouchakour, Patrick Loumeau:
A comparative study of two SC-CMFB networks used in fully differential OTA. ICECS 1998: 291-294
Coauthor Index
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