Deterioration Behavior Analysis and LSTM-Based Failure Prediction of GIB Electrical Contact Inside Various Insulation Gases.

Wed, 01 Jan 2020 00:00:00 +0100

Xiangyu Guan , Yuequan Wen, Zhe Dong, Naiqiu Shu, Hui Peng, Wei Gao , David Wenzhong Gao :
Deterioration Behavior Analysis and LSTM-Based Failure Prediction of GIB Electrical Contact Inside Various Insulation Gases. IEEE Access 8: 152367-152376 (2020)