A Precision On-Chip Measurement Technique for Dielectric Absorption of an Integrated Capacitor.

Wed, 01 Jan 2014 00:00:00 +0100

Young-Cheon Kwon, Oh-Kyong Kwon:
A Precision On-Chip Measurement Technique for Dielectric Absorption of an Integrated Capacitor. IEEE Trans. Instrum. Meas. 63(6): 1613-1619 (2014)