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F. van Rijs

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2006
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P. J. van der Wel, S. J. C. H. Theeuwen, J. A. Bielen, Y. Li, R. A. van den Heuvel, J. G. Gommans, F. van Rijs, P. Bron, H. J. F. Peuscher:
Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications. Microelectron. Reliab. 46(8): 1279-1284 (2006)

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