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Hyungjin Kim 0001
Person information
- affiliation: Inha University, Department of Electrical Engineering, Incheon, South Korea
- affiliation (2019 - 2020): Yeungnam University, Department of Electrical Engineering, Gyeongsan, South Korea
- affiliation (2018 - 2019): University of California Santa Barbara, Department of Electrical and Computer Engineering, CA, USA
- affiliation (PhD 2017): Seoul National University, Department of Electrical and Computer Engineering, South Korea
- not to be confused with: Hyungjin Kim 0004
Other persons with the same name
- Hyungjin Kim (aka: Hyung-jin Kim, Hyung-Jin Kim) — disambiguation page
- Hyungjin Kim 0002 — Korea Advanced Institute of Science and Technology, Urban Robotics Lab, Daejeon, South Korea
- Hyungjin Kim 0003 — University of California Los Angeles, CA, USA
- Hyungjin Kim 0004
— Inha University, Department of Electrical and Computer Engineering, Incheon, South Korea
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2020 – today
- 2024
[j13]Sungjoon Kim
, Kyungho Hong, Hyungjin Kim, Min-Hwi Kim
, Woo Young Choi
:
Overshoot-Suppressed Memristor Array with AlN Oxygen Barrier for Low-Power Operation in the Intelligent Neuromorphic Systems. Adv. Intell. Syst. 6(8) (2024)
[j12]Sangwook Youn
, Yeongjin Hwang, Tae-Hyeon Kim
, Sungjoon Kim
, Hwiho Hwang
, Jinwoo Park, Hyungjin Kim
:
Threshold learning algorithm for memristive neural network with binary switching behavior. Neural Networks 176: 106355 (2024)- 2023
[j11]Sangwook Youn, Sungjoon Kim
, Tae-Hyeon Kim, Jinwoo Park, Hyungjin Kim
:
Memristor Crossbar Circuit for Ternary Content-Addressable Memory with Fine-Tuning Operation. Adv. Intell. Syst. 5(3) (2023)
[j10]Min Suk Song
, Tae-Hyeon Kim, Hwiho Hwang
, Suhyeon Ahn, Hussein Nili, Hyungjin Kim
:
Optimization of Random Telegraph Noise Characteristics in Memristor for True Random Number Generator. Adv. Intell. Syst. 5(5) (2023)- 2022
[j9]Sungjoon Kim, Jinwoo Park, Tae-Hyeon Kim, Kyungho Hong, Yeongjin Hwang, Byung-Gook Park, Hyungjin Kim
:
4-bit Multilevel Operation in Overshoot Suppressed Al2O3/TiOx Resistive Random-Access Memory Crossbar Array. Adv. Intell. Syst. 4(9) (2022)- 2021
[j8]Dayoung Kim
, Tae-Hyeon Kim
, Yun-Yeong Choi, Geun Ho Lee
, Jungwon Lee, Wookyung Sun
, Byung-Gook Park
, Hyungjin Kim
, Hyungsoon Shin
:
Selected Bit-Line Current PUF: Implementation of Hardware Security Primitive Based on a Memristor Crossbar Array. IEEE Access 9: 120901-120910 (2021)- 2020
[j7]Jun Tae Jang
, Jungi Min, Yeongjin Hwang, Sung-Jin Choi
, Dong Myong Kim
, Hyungjin Kim
, Dae Hwan Kim
:
Digital and Analog Switching Characteristics of InGaZnO Memristor Depending on Top Electrode Material for Neuromorphic System. IEEE Access 8: 192304-192311 (2020)
2010 – 2019
- 2019
[c1]Irina Kataeva, Shigeki Ohtsuka, Hussein Nili, Hyungjin Kim
, Yoshihiko Isobe, Koichi Yako, Dmitri B. Strukov
:
Towards the Development of Analog Neuromorphic Chip Prototype with 2.4M Integrated Memristors. ISCAS 2019: 1-5
[i1]Hyungjin Kim, Hussein Nili, Mahmood Mahmoodi, Dmitri B. Strukov:
4K-Memristor Analog-Grade Passive Crossbar Circuit. CoRR abs/1906.12045 (2019)- 2013
[j6]Min-Chul Sun, Sang Wan Kim, Garam Kim, Hyun Woo Kim, Hyungjin Kim
, Byung-Gook Park:
Novel Tunneling Field-Effect Transistor with Sigma-Shape Embedded SiGe Sources and Recessed Channel. IEICE Trans. Electron. 96-C(5): 639-643 (2013)- 2012
[j5]Seongjae Cho, Hyungjin Kim
, Min-Chul Sun, In Man Kang, Byung-Gook Park, James S. Harris Jr.:
Simulation study on scaling limit of silicon tunneling field-effect transistor under tunneling-predominance. IEICE Electron. Express 9(9): 828-833 (2012)
[j4]Hyungjin Kim
, Min-Chul Sun, Hyun Woo Kim, Sang Wan Kim, Garam Kim, Byung-Gook Park:
Study on Threshold Voltage Control of Tunnel Field-Effect Transistors Using VT-Control Doping Region. IEICE Trans. Electron. 95-C(5): 820-825 (2012)
[j3]Min-Chul Sun, Hyun Woo Kim, Sang Wan Kim, Garam Kim, Hyungjin Kim
, Byung-Gook Park:
Comparative Study on Top- and Bottom-Source Vertical-Channel Tunnel Field-Effect Transistors. IEICE Trans. Electron. 95-C(5): 826-830 (2012)
[j2]Se Hwan Park, Yoon Kim, Wandong Kim, Joo Yun Seo, Hyungjin Kim
, Byung-Gook Park:
Novel Three Dimensional (3D) NAND Flash Memory Array Having Tied Bit-line and Ground Select Transistor (TiGer). IEICE Trans. Electron. 95-C(5): 837-841 (2012)
[j1]Kyung-Chang Ryoo, Jeong-Hoon Oh, Sunghun Jung, Hyungjin Kim
, Byung-Gook Park:
Effects of Conductive Defects on Unipolar RRAM for the Improvement of Resistive Switching Characteristics. IEICE Trans. Electron. 95-C(5): 842-846 (2012)
Coauthor Index

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last updated on 2026-01-05 23:38 CET by the dblp team
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