Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation.

Mon, 01 Jan 1996 00:00:00 +0100

F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira:
Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. ITC 1996: 620-628