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Yoichi Nogami

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2009
[j2]
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  dblp key:
  - journals/mr/HisakaSNHYVAHA09
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  persistent URL:
  - https://dblp.org/rec/journals/mr/HisakaSNHYVAHA09
Takayuki Hisaka, Hajime Sasaki, Yoichi Nogami, Kenji Hosogi, Naohito Yoshida, Anita A. Villanueva, Jesús A. del Alamo, Shigehiko Hasegawa, Hajime Asahi:
Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions. Microelectron. Reliab. 49(12): 1515-1519 (2009)
2005
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  - https://dblp.org/rec/journals/mr/HisakaANSUYH05
Takayuki Hisaka, Yasuki Aihara, Yoichi Nogami, Hajime Sasaki, Yasushi Uehara, Naohito Yoshida, Kazuo Hayashi:
Degradation mechanisms of GaAs PHEMTs in high humidity conditions. Microelectron. Reliab. 45(12): 1894-1900 (2005)

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