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Dae Hyun Ka

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2000 – 2009

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2009
[j2]
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  - https://dblp.org/rec/journals/mr/JeonKYCIP09
Yong Woo Jeon, Dae Hyun Ka, Chong-Gun Yu, Won-Ju Cho, M. Saif Islam, Jong Tae Park:
NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer. Microelectron. Reliab. 49(9-11): 994-997 (2009)
2007
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Sung Jun Jang, Dae Hyun Ka, Chong-Gun Yu, Kwan-Su Kim, Won-Ju Cho, Jong Tae Park:
Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs. Microelectron. Reliab. 47(9-11): 1411-1415 (2007)

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