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BibTeX record conf/aipr/DabbiruWHWBADDJ15
@inproceedings{DBLP:conf/aipr/DabbiruWHWBADDJ15, author = {Lalitha Dabbiru and Pan Wei and Archit Harsh and Julie White and John E. Ball and James V. Aanstoos and Patrick Donohoe and Jesse Doyle and Sam Jackson and John Newman}, title = {Runway assessment via remote sensing}, booktitle = {2015 {IEEE} Applied Imagery Pattern Recognition Workshop, {AIPR} 2015, Washington, DC, USA, October 13-15, 2015}, pages = {1--4}, publisher = {{IEEE} Computer Society}, year = {2015}, url = {https://doi.org/10.1109/AIPR.2015.7444545}, doi = {10.1109/AIPR.2015.7444545}, timestamp = {Fri, 24 Mar 2023 00:03:39 +0100}, biburl = {https://dblp.org/rec/conf/aipr/DabbiruWHWBADDJ15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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