BibTeX record conf/asicon/YangCWL13

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@inproceedings{DBLP:conf/asicon/YangCWL13,
  author       = {Xuan Yang and
                  Xiaole Cui and
                  Chao Wang and
                  Chung Len Lee},
  title        = {A test pattern selection method for dynamic burn-in of logic circuits
                  based on {ATPG} technique},
  booktitle    = {{IEEE} 10th International Conference on ASIC, {ASICON} 2013, Shenzhen,
                  China, October 28-31, 2013},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/ASICON.2013.6811958},
  doi          = {10.1109/ASICON.2013.6811958},
  timestamp    = {Tue, 07 Mar 2023 08:43:13 +0100},
  biburl       = {https://dblp.org/rec/conf/asicon/YangCWL13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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