BibTeX record conf/aspdac/FangS11

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@inproceedings{DBLP:conf/aspdac/FangS11,
  author    = {Jianxin Fang and
               Sachin S. Sapatnekar},
  title     = {Accounting for inherent circuit resilience and process variations
               in analyzing gate oxide reliability},
  booktitle = {Proceedings of the 16th Asia South Pacific Design Automation Conference,
               {ASP-DAC} 2011, Yokohama, Japan, January 25-27, 2011},
  pages     = {689--694},
  year      = {2011},
  crossref  = {DBLP:conf/aspdac/2011},
  url       = {https://doi.org/10.1109/ASPDAC.2011.5722275},
  doi       = {10.1109/ASPDAC.2011.5722275},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/FangS11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2011,
  title     = {Proceedings of the 16th Asia South Pacific Design Automation Conference,
               {ASP-DAC} 2011, Yokohama, Japan, January 25-27, 2011},
  publisher = {{IEEE}},
  year      = {2011},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5716646/proceeding},
  isbn      = {978-1-4244-7516-2},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/2011},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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