BibTeX record conf/aspdac/HigamiSTKT06

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@inproceedings{DBLP:conf/aspdac/HigamiSTKT06,
  author    = {Yoshinobu Higami and
               Kewal K. Saluja and
               Hiroshi Takahashi and
               Shin{-}ya Kobayashi and
               Yuzo Takamatsu},
  title     = {Compaction of pass/fail-based diagnostic test vectors for combinational
               and sequential circuits},
  booktitle = {Proceedings of the 2006 Conference on Asia South Pacific Design Automation:
               {ASP-DAC} 2006, Yokohama, Japan, January 24-27, 2006},
  pages     = {659--664},
  year      = {2006},
  crossref  = {DBLP:conf/aspdac/2006},
  url       = {https://doi.org/10.1109/ASPDAC.2006.1594761},
  doi       = {10.1109/ASPDAC.2006.1594761},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/HigamiSTKT06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2006,
  editor    = {Fumiyasu Hirose},
  title     = {Proceedings of the 2006 Conference on Asia South Pacific Design Automation:
               {ASP-DAC} 2006, Yokohama, Japan, January 24-27, 2006},
  publisher = {{IEEE}},
  year      = {2006},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/10626/proceeding},
  doi       = {10.1145/1118299},
  isbn      = {0-7803-9451-8},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/2006},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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