BibTeX record conf/aspdac/HigamiSTKT06

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@inproceedings{DBLP:conf/aspdac/HigamiSTKT06,
  author       = {Yoshinobu Higami and
                  Kewal K. Saluja and
                  Hiroshi Takahashi and
                  Shin{-}ya Kobayashi and
                  Yuzo Takamatsu},
  editor       = {Fumiyasu Hirose},
  title        = {Compaction of pass/fail-based diagnostic test vectors for combinational
                  and sequential circuits},
  booktitle    = {Proceedings of the 2006 Conference on Asia South Pacific Design Automation:
                  {ASP-DAC} 2006, Yokohama, Japan, January 24-27, 2006},
  pages        = {659--664},
  publisher    = {{IEEE}},
  year         = {2006},
  url          = {https://doi.org/10.1109/ASPDAC.2006.1594761},
  doi          = {10.1109/ASPDAC.2006.1594761},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/HigamiSTKT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}