BibTeX record conf/aspdac/KawakamiFYIWCKCYL00

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@inproceedings{DBLP:conf/aspdac/KawakamiFYIWCKCYL00,
  author       = {Yoshiyuki Kawakami and
                  Jingkun Fang and
                  Hirokazu Yonezawa and
                  Nobufusa Iwanishi and
                  Lifeng Wu and
                  Alvin I{-}Hsien Chen and
                  Norio Koike and
                  Ping Chen and
                  Chune{-}Sin Yeh and
                  Zhihong Liu},
  title        = {Gate-level aged timing simulation methodology for hot-carrier reliability
                  assurance},
  booktitle    = {Proceedings of {ASP-DAC} 2000, Asia and South Pacific Design Automation
                  Conference 2000, Yokohama, Japan},
  pages        = {289--294},
  publisher    = {{ACM}},
  year         = {2000},
  url          = {https://doi.org/10.1145/368434.368636},
  doi          = {10.1145/368434.368636},
  timestamp    = {Thu, 23 Mar 2023 23:58:21 +0100},
  biburl       = {https://dblp.org/rec/conf/aspdac/KawakamiFYIWCKCYL00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}