BibTeX record conf/aspdac/TilleGPGS18

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@inproceedings{DBLP:conf/aspdac/TilleGPGS18,
  author       = {Daniel Tille and
                  Benedikt Gottinger and
                  Ulrike Pfannkuchen and
                  Helmut Graeb and
                  Ulf Schlichtmann},
  editor       = {Youngsoo Shin},
  title        = {On enabling diagnosis for 1-Pin Test fails in an industrial flow},
  booktitle    = {23rd Asia and South Pacific Design Automation Conference, {ASP-DAC}
                  2018, Jeju, Korea (South), January 22-25, 2018},
  pages        = {233--238},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ASPDAC.2018.8297311},
  doi          = {10.1109/ASPDAC.2018.8297311},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/TilleGPGS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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