BibTeX record conf/ats/HsiungC0GG13

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@inproceedings{DBLP:conf/ats/HsiungC0GG13,
  author       = {Hsunwei Hsiung and
                  Da Cheng and
                  Bin Liu and
                  Ramesh Govindan and
                  Sandeep K. Gupta},
  title        = {Interplay of Failure Rate, Performance, and Test Cost in {TCAM} under
                  Process Variations},
  booktitle    = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
                  18-21, 2013},
  pages        = {251--258},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/ATS.2013.54},
  doi          = {10.1109/ATS.2013.54},
  timestamp    = {Fri, 22 Sep 2023 10:12:26 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/HsiungC0GG13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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