BibTeX record conf/ats/LeeHC00

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@inproceedings{DBLP:conf/ats/LeeHC00,
  author       = {Kuen{-}Jong Lee and
                  Tsung{-}Chu Huang and
                  Jih{-}Jeen Chen},
  title        = {Peak-power reduction for multiple-scan circuits during test application},
  booktitle    = {9th Asian Test Symposium {(ATS} 2000), 4-6 December 2000, Taipei,
                  Taiwan},
  pages        = {453--458},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/ATS.2000.893666},
  doi          = {10.1109/ATS.2000.893666},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LeeHC00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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