BibTeX record conf/ccece/WangLL0HK16

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@inproceedings{DBLP:conf/ccece/WangLL0HK16,
  author       = {Haibin Wang and
                  Rui Liu and
                  Xuantian Li and
                  Li Chen and
                  David M. Hiemstra and
                  Valeri Kirischian},
  title        = {Total ionizing dose test facilities for micro-electronic circuits},
  booktitle    = {2016 {IEEE} Canadian Conference on Electrical and Computer Engineering,
                  {CCECE} 2016, Vancouver, BC, Canada, May 15-18, 2016},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/CCECE.2016.7726602},
  doi          = {10.1109/CCECE.2016.7726602},
  timestamp    = {Sun, 02 Oct 2022 15:56:09 +0200},
  biburl       = {https://dblp.org/rec/conf/ccece/WangLL0HK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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