BibTeX record conf/date/Shamsi0PJ19

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@inproceedings{DBLP:conf/date/Shamsi0PJ19,
  author       = {Kaveh Shamsi and
                  Meng Li and
                  David Z. Pan and
                  Yier Jin},
  editor       = {J{\"{u}}rgen Teich and
                  Franco Fummi},
  title        = {{KC2:} Key-Condition Crunching for Fast Sequential Circuit Deobfuscation},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2019, Florence, Italy, March 25-29, 2019},
  pages        = {534--539},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.23919/DATE.2019.8715053},
  doi          = {10.23919/DATE.2019.8715053},
  timestamp    = {Sat, 09 Apr 2022 12:47:49 +0200},
  biburl       = {https://dblp.org/rec/conf/date/Shamsi0PJ19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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