BibTeX record conf/ddecs/JasnetskiRTU15

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@inproceedings{DBLP:conf/ddecs/JasnetskiRTU15,
  author       = {Artjom Jasnetski and
                  Jaan Raik and
                  Anton Tsertov and
                  Raimund Ubar},
  editor       = {Zoran Stamenkovic and
                  Witold A. Pleskacz and
                  Jaan Raik and
                  Heinrich Theodor Vierhaus},
  title        = {New Fault Models and Self-Test Generation for Microprocessors Using
                  High-Level Decision Diagrams},
  booktitle    = {18th {IEEE} International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2015, Belgrade, Serbia, April 22-24,
                  2015},
  pages        = {251--254},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/DDECS.2015.56},
  doi          = {10.1109/DDECS.2015.56},
  timestamp    = {Fri, 24 Mar 2023 00:04:14 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/JasnetskiRTU15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}