BibTeX record conf/ddecs/SfikasT09

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@inproceedings{DBLP:conf/ddecs/SfikasT09,
  author       = {Yiorgos Sfikas and
                  Yiorgos Tsiatouhas},
  title        = {Physical design oriented {DRAM} Neighborhood Pattern Sensitive Fault
                  testing},
  booktitle    = {Proceedings of the 2009 {IEEE} Symposium on Design and Diagnostics
                  of Electronic Circuits and Systems, {DDECS} 2009, April 15-17, 2009,
                  Liberec, Czech Republic},
  pages        = {108--113},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/DDECS.2009.5012108},
  doi          = {10.1109/DDECS.2009.5012108},
  timestamp    = {Fri, 24 Mar 2023 00:04:14 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/SfikasT09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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