BibTeX record conf/delta/UbarDRJ10

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@inproceedings{DBLP:conf/delta/UbarDRJ10,
  author       = {Raimund Ubar and
                  Sergei Devadze and
                  Jaan Raik and
                  Artur Jutman},
  title        = {Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits},
  booktitle    = {Fifth {IEEE} International Symposium on Electronic Design, Test {\&}
                  Applications, {DELTA} 2010, Ho Chi Minh City, Vietnam, January 13-15,
                  2010},
  pages        = {14--19},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/DELTA.2010.32},
  doi          = {10.1109/DELTA.2010.32},
  timestamp    = {Fri, 24 Mar 2023 00:04:37 +0100},
  biburl       = {https://dblp.org/rec/conf/delta/UbarDRJ10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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