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BibTeX record conf/dft/ChengG12
@inproceedings{DBLP:conf/dft/ChengG12, author = {Da Cheng and Sandeep K. Gupta}, title = {A systematic methodology to improve yield per area of highly-parallel CMPs}, booktitle = {2012 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA, October 3-5, 2012}, pages = {126--133}, publisher = {{IEEE} Computer Society}, year = {2012}, url = {https://doi.org/10.1109/DFT.2012.6378212}, doi = {10.1109/DFT.2012.6378212}, timestamp = {Fri, 22 Sep 2023 10:12:26 +0200}, biburl = {https://dblp.org/rec/conf/dft/ChengG12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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