BibTeX record conf/esem/RaaschouR08

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@inproceedings{DBLP:conf/esem/RaaschouR08,
  author       = {Keld Raaschou and
                  Austen W. Rainer},
  editor       = {H. Dieter Rombach and
                  Sebastian G. Elbaum and
                  J{\"{u}}rgen M{\"{u}}nch},
  title        = {Exposure model for prediction of number of customer reported defects},
  booktitle    = {Proceedings of the Second International Symposium on Empirical Software
                  Engineering and Measurement, {ESEM} 2008, October 9-10, 2008, Kaiserslautern,
                  Germany},
  pages        = {306--308},
  publisher    = {{ACM}},
  year         = {2008},
  url          = {https://doi.org/10.1145/1414004.1414062},
  doi          = {10.1145/1414004.1414062},
  timestamp    = {Fri, 27 Dec 2019 21:30:14 +0100},
  biburl       = {https://dblp.org/rec/conf/esem/RaaschouR08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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