BibTeX record conf/ets/BonhommeYFG04

download as .bib file

@inproceedings{DBLP:conf/ets/BonhommeYFG04,
  author       = {Yannick Bonhomme and
                  Tomokazu Yoneda and
                  Hideo Fujiwara and
                  Patrick Girard},
  title        = {An efficient scan tree design for test time reduction},
  booktitle    = {9th European Test Symposium, {ETS} 2004, Ajaccio, France, May 23-26,
                  2004},
  pages        = {174--179},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/ETSYM.2004.1347657},
  doi          = {10.1109/ETSYM.2004.1347657},
  timestamp    = {Thu, 23 Mar 2023 23:58:22 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/BonhommeYFG04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.