BibTeX record conf/ets/WeiLW16

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@inproceedings{DBLP:conf/ets/WeiLW16,
  author       = {Sin{-}Yu Wei and
                  Bing{-}Yang Lin and
                  Cheng{-}Wen Wu},
  title        = {A fast sweep-line-based failure pattern extractor for memory diagnosis},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519314},
  doi          = {10.1109/ETS.2016.7519314},
  timestamp    = {Sat, 30 Sep 2023 09:40:35 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/WeiLW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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