BibTeX record conf/hase/YuDLKK14

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@inproceedings{DBLP:conf/hase/YuDLKK14,
  author       = {Linbin Yu and
                  Feng Duan and
                  Yu Lei and
                  Raghu Kacker and
                  D. Richard Kuhn},
  title        = {Combinatorial Test Generation for Software Product Lines Using Minimum
                  Invalid Tuples},
  booktitle    = {15th International {IEEE} Symposium on High-Assurance Systems Engineering,
                  {HASE} 2014, Miami Beach, FL, USA, January 9-11, 2014},
  pages        = {65--72},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/HASE.2014.18},
  doi          = {10.1109/HASE.2014.18},
  timestamp    = {Fri, 24 Mar 2023 00:03:12 +0100},
  biburl       = {https://dblp.org/rec/conf/hase/YuDLKK14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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