BibTeX record conf/iccad/SucarCW89

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@inproceedings{DBLP:conf/iccad/SucarCW89,
  author       = {Hector R. Sucar and
                  Susheel J. Chandra and
                  David J. Wharton},
  title        = {High performance test generation for accurate defect models in {CMOS}
                  gate array technology},
  booktitle    = {1989 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
                  1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical
                  Papers},
  pages        = {166--169},
  publisher    = {{IEEE} Computer Society},
  year         = {1989},
  url          = {https://doi.org/10.1109/ICCAD.1989.76928},
  doi          = {10.1109/ICCAD.1989.76928},
  timestamp    = {Fri, 24 Mar 2023 00:01:52 +0100},
  biburl       = {https://dblp.org/rec/conf/iccad/SucarCW89.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}