BibTeX record conf/iccad/WangCT12

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@inproceedings{DBLP:conf/iccad/WangCT12,
  author       = {Shuo Wang and
                  Jifeng Chen and
                  Mohammad Tehranipoor},
  editor       = {Alan J. Hu},
  title        = {Representative Critical Reliability Paths for low-cost and accurate
                  on-chip aging evaluation},
  booktitle    = {2012 {IEEE/ACM} International Conference on Computer-Aided Design,
                  {ICCAD} 2012, San Jose, CA, USA, November 5-8, 2012},
  pages        = {736--741},
  publisher    = {{ACM}},
  year         = {2012},
  url          = {https://doi.org/10.1145/2429384.2429543},
  doi          = {10.1145/2429384.2429543},
  timestamp    = {Mon, 09 Aug 2021 17:01:45 +0200},
  biburl       = {https://dblp.org/rec/conf/iccad/WangCT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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