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BibTeX record conf/icip/JanssensBDVNS15
@inproceedings{DBLP:conf/icip/JanssensBDVNS15, author = {Eline Janssens and Jan De Beenhouwer and Mattias Van Dael and Pieter Verboven and Bart M. Nicola{\"{\i}} and Jan Sijbers}, title = {Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system}, booktitle = {2015 {IEEE} International Conference on Image Processing, {ICIP} 2015, Quebec City, QC, Canada, September 27-30, 2015}, pages = {917--921}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/ICIP.2015.7350933}, doi = {10.1109/ICIP.2015.7350933}, timestamp = {Thu, 14 Oct 2021 10:10:07 +0200}, biburl = {https://dblp.org/rec/conf/icip/JanssensBDVNS15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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