BibTeX record conf/icip/JanssensBDVNS15

download as .bib file

@inproceedings{DBLP:conf/icip/JanssensBDVNS15,
  author       = {Eline Janssens and
                  Jan De Beenhouwer and
                  Mattias Van Dael and
                  Pieter Verboven and
                  Bart M. Nicola{\"{\i}} and
                  Jan Sijbers},
  title        = {Neural netwok based X-ray tomography for fast inspection of apples
                  on a conveyor belt system},
  booktitle    = {2015 {IEEE} International Conference on Image Processing, {ICIP} 2015,
                  Quebec City, QC, Canada, September 27-30, 2015},
  pages        = {917--921},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ICIP.2015.7350933},
  doi          = {10.1109/ICIP.2015.7350933},
  timestamp    = {Thu, 14 Oct 2021 10:10:07 +0200},
  biburl       = {https://dblp.org/rec/conf/icip/JanssensBDVNS15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.