BibTeX record conf/idt/El-DinFIGM16

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@inproceedings{DBLP:conf/idt/El-DinFIGM16,
  author    = {Mohamed Mohie El{-}Din and
               Hossam A. H. Fahmy and
               Yehea Ismail and
               Noha Gamal and
               Hassan Mostafa},
  title     = {Leakage power evaluation of FinFET-based {FPGA} cluster under threshold
               voltage variation},
  booktitle = {11th International Design {\&} Test Symposium, {IDT} 2016, Hammamet,
               Tunisia, December 18-20, 2016},
  pages     = {137--141},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/IDT.2016.7843029},
  doi       = {10.1109/IDT.2016.7843029},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/conf/idt/El-DinFIGM16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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