BibTeX record conf/incdm/St-PierreT11

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@inproceedings{DBLP:conf/incdm/St-PierreT11,
  author       = {{\'{E}}ric St.{-}Pierre and
                  Eugene Tuv},
  editor       = {Petra Perner},
  title        = {Robust, Non-Redundant Feature Selection for Yield Analysis in Semiconductor
                  Manufacturing},
  booktitle    = {Advances in Data Mining. Applications and Theoretical Aspects - 11th
                  Industrial Conference, {ICDM} 2011, New York, NY, USA, August 30 -
                  September 3, 2011. Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {6870},
  pages        = {204--217},
  publisher    = {Springer},
  year         = {2011},
  url          = {https://doi.org/10.1007/978-3-642-23184-1\_16},
  doi          = {10.1007/978-3-642-23184-1\_16},
  timestamp    = {Tue, 14 May 2019 10:00:51 +0200},
  biburl       = {https://dblp.org/rec/conf/incdm/St-PierreT11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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