BibTeX record conf/iolts/AhlawatTMS16

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@inproceedings{DBLP:conf/iolts/AhlawatTMS16,
  author       = {Satyadev Ahlawat and
                  Jaynarayan T. Tudu and
                  Anzhela Yu. Matrosova and
                  Virendra Singh},
  title        = {A high performance scan flip-flop design for serial and mixed mode
                  scan test},
  booktitle    = {22nd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2016, Sant Feliu de Guixols, Spain, July 4-6,
                  2016},
  pages        = {233--238},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/IOLTS.2016.7604709},
  doi          = {10.1109/IOLTS.2016.7604709},
  timestamp    = {Sun, 25 Oct 2020 22:46:51 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/AhlawatTMS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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