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BibTeX record conf/iolts/HamadKMS17
@inproceedings{DBLP:conf/iolts/HamadKMS17, author = {Ghaith Bany Hamad and Ghaith Kazma and Otmane A{\"{\i}}t Mohamed and Yvon Savaria}, title = {Comprehensive analysis of sequential circuits vulnerability to transient faults using {SMT}}, booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017}, pages = {33--38}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/IOLTS.2017.8046195}, doi = {10.1109/IOLTS.2017.8046195}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/iolts/HamadKMS17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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