BibTeX record conf/irps/KurachiYNSTYF18

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@inproceedings{DBLP:conf/irps/KurachiYNSTYF18,
  author       = {Yasuyo Kurachi and
                  Hiroshi Yamamoto and
                  Yukinori Nose and
                  Satoshi Shimizu and
                  Yasunori Tateno and
                  Takumi Yonemura and
                  Masato Furukawa},
  title        = {Failure mode analysis of GaN-HEMT under high temperature operation},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {3--1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353706},
  doi          = {10.1109/IRPS.2018.8353706},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KurachiYNSTYF18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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