BibTeX record conf/irps/MalherbeGSPAR15

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@inproceedings{DBLP:conf/irps/MalherbeGSPAR15,
  author       = {Victor Malherbe and
                  Gilles Gasiot and
                  Dimitri Soussan and
                  Aurelien Patris and
                  Jean{-}Luc Autran and
                  Philippe Roche},
  title        = {Alpha soft error rate of {FDSOI} 28 nm SRAMs: Experimental testing
                  and simulation analysis},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {11},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112829},
  doi          = {10.1109/IRPS.2015.7112829},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/MalherbeGSPAR15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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