BibTeX record conf/irps/RenLWZYLSWZGWXH18

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@inproceedings{DBLP:conf/irps/RenLWZYLSWZGWXH18,
  author       = {Pengpeng Ren and
                  Changze Liu and
                  Sanping Wan and
                  Jiayang Zhang and
                  Zhuoqing Yu and
                  Nie Liu and
                  Yongsheng Sun and
                  Runsheng Wang and
                  Canhui Zhan and
                  Zhenghao Gan and
                  Waisum Wong and
                  Yu Xia and
                  Ru Huang},
  title        = {New insights into the {HCI} degradation of pass-gate transistor in
                  advanced FinFET technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {3--1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353656},
  doi          = {10.1109/IRPS.2018.8353656},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/RenLWZYLSWZGWXH18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}