BibTeX record conf/irps/ZhuBTLBHHZCQW19

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@inproceedings{DBLP:conf/irps/ZhuBTLBHHZCQW19,
  author       = {Benyuan Zhu and
                  E. M. Bazizi and
                  J. H. M. Tng and
                  Z. Li and
                  E. K. Banghart and
                  M. K. Hassan and
                  Y. Hu and
                  D. Zhou and
                  D. Choi and
                  L. Qin and
                  Xuan Wan},
  title        = {{TCAD} Simulation on FinFET n-type Power Device {HCI} Reliability
                  Improvement},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720558},
  doi          = {10.1109/IRPS.2019.8720558},
  timestamp    = {Fri, 14 Jan 2022 22:13:48 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/ZhuBTLBHHZCQW19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}