BibTeX record conf/iscas/AdhamARR00

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@inproceedings{DBLP:conf/iscas/AdhamARR00,
  author       = {Saman Adham and
                  Dhamin Al{-}Khalili and
                  C{\^{o}}me Rozon and
                  Douglas Racz},
  title        = {Comprehensive defect analysis and testability of current-mode logic
                  circuits},
  booktitle    = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2000,
                  Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31
                  May 2000, Proceedings},
  pages        = {339--342},
  publisher    = {{IEEE}},
  year         = {2000},
  url          = {https://doi.org/10.1109/ISCAS.2000.857099},
  doi          = {10.1109/ISCAS.2000.857099},
  timestamp    = {Fri, 13 Aug 2021 09:26:01 +0200},
  biburl       = {https://dblp.org/rec/conf/iscas/AdhamARR00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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