BibTeX record conf/iscas/WangC15

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@inproceedings{DBLP:conf/iscas/WangC15,
  author       = {Runsheng Wang and
                  Yu Cao},
  title        = {Impact of temporal transistor variations on circuit reliability},
  booktitle    = {2015 {IEEE} International Symposium on Circuits and Systems, {ISCAS}
                  2015, Lisbon, Portugal, May 24-27, 2015},
  pages        = {2453--2456},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ISCAS.2015.7169181},
  doi          = {10.1109/ISCAS.2015.7169181},
  timestamp    = {Thu, 15 Apr 2021 16:06:39 +0200},
  biburl       = {https://dblp.org/rec/conf/iscas/WangC15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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