BibTeX record conf/isi/LiY11

download as .bib file

@inproceedings{DBLP:conf/isi/LiY11,
  author       = {Xue{-}Jing Li and
                  Dan Yu},
  title        = {A reliability integrated acceptance test plan for series systems whose
                  components following exponential distributions},
  booktitle    = {2011 {IEEE} International Conference on Intelligence and Security
                  Informatics, {ISI} 2011, Beijing, China, 10-12 July, 2011},
  pages        = {339--344},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/ISI.2011.5984110},
  doi          = {10.1109/ISI.2011.5984110},
  timestamp    = {Wed, 16 Oct 2019 14:14:48 +0200},
  biburl       = {https://dblp.org/rec/conf/isi/LiY11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics