BibTeX record conf/islped/RaoSBS03

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@inproceedings{DBLP:conf/islped/RaoSBS03,
  author       = {Rajeev R. Rao and
                  Ashish Srivastava and
                  David T. Blaauw and
                  Dennis Sylvester},
  editor       = {Ingrid Verbauwhede and
                  Hyung Roh},
  title        = {Statistical estimation of leakage current considering inter- and intra-die
                  process variation},
  booktitle    = {Proceedings of the 2003 International Symposium on Low Power Electronics
                  and Design, 2003, Seoul, Korea, August 25-27, 2003},
  pages        = {84--89},
  publisher    = {{ACM}},
  year         = {2003},
  url          = {https://doi.org/10.1145/871506.871530},
  doi          = {10.1145/871506.871530},
  timestamp    = {Tue, 06 Nov 2018 16:59:21 +0100},
  biburl       = {https://dblp.org/rec/conf/islped/RaoSBS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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