BibTeX record conf/isqed/BickfordHBKMPS06

download as .bib file

@inproceedings{DBLP:conf/isqed/BickfordHBKMPS06,
  author       = {Jeanne Bickford and
                  Jason Hibbeler and
                  Markus B{\"{u}}hler and
                  J{\"{u}}rgen Koehl and
                  Dirk M{\"{u}}ller and
                  Sven Peyer and
                  Christian Schulte},
  title        = {Yield Improvement by Local Wiring Redundancy},
  booktitle    = {7th International Symposium on Quality of Electronic Design {(ISQED}
                  2006), 27-29 March 2006, San Jose, CA, {USA}},
  pages        = {473--478},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ISQED.2006.148},
  doi          = {10.1109/ISQED.2006.148},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/BickfordHBKMPS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.