BibTeX record conf/isqed/LiLYMCCZO01

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@inproceedings{DBLP:conf/isqed/LiLYMCCZO01,
  author       = {Wei Li and
                  Qiang Li and
                  J. S. Yuan and
                  Joshua McConkey and
                  Yuan Chen and
                  Sundar Chetlur and
                  Jonathan Zhou and
                  A. S. Oates},
  title        = {Hot-carrier-Induced Circuit Degradation for 0.18 {\(\mathrm{\mu}\)}m
                  {CMOS} Technology},
  booktitle    = {2nd International Symposium on Quality of Electronic Design {(ISQED}
                  2001), 26-28 March 2001, San Jose, CA, {USA}},
  pages        = {284--289},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/ISQED.2001.915244},
  doi          = {10.1109/ISQED.2001.915244},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/LiLYMCCZO01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}