BibTeX record conf/isqed/LiLYMCCZO01

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@inproceedings{DBLP:conf/isqed/LiLYMCCZO01,
  author    = {Wei Li and
               Qiang Li and
               J. S. Yuan and
               Joshua McConkey and
               Yuan Chen and
               Sundar Chetlur and
               Jonathan Zhou and
               A. S. Oates},
  title     = {Hot-carrier-Induced Circuit Degradation for 0.18 {\(\mathrm{\mu}\)}m
               {CMOS} Technology},
  booktitle = {2nd International Symposium on Quality of Electronic Design {(ISQED}
               2001), 26-28 March 2001, San Jose, CA, {USA}},
  pages     = {284--289},
  year      = {2001},
  crossref  = {DBLP:conf/isqed/2001},
  url       = {https://doi.org/10.1109/ISQED.2001.915244},
  doi       = {10.1109/ISQED.2001.915244},
  timestamp = {Thu, 25 May 2017 00:42:47 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/LiLYMCCZO01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/isqed/2001,
  title     = {2nd International Symposium on Quality of Electronic Design {(ISQED}
               2001), 26-28 March 2001, San Jose, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7308},
  isbn      = {0-7695-1025-6},
  timestamp = {Fri, 26 Sep 2014 14:08:23 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}