BibTeX record conf/isqed/SatoUHOANM07

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@inproceedings{DBLP:conf/isqed/SatoUHOANM07,
  author       = {Takashi Sato and
                  Takumi Uezono and
                  Shiho Hagiwara and
                  Kenichi Okada and
                  Shuhei Amakawa and
                  Noriaki Nakayama and
                  Kazuya Masu},
  title        = {A {MOS} Transistor-Array for Accurate Measurement of Subthreshold
                  Leakage Variation},
  booktitle    = {8th International Symposium on Quality of Electronic Design {(ISQED}
                  2007), 26-28 March 2007, San Jose, CA, {USA}},
  pages        = {21--26},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/ISQED.2007.17},
  doi          = {10.1109/ISQED.2007.17},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/SatoUHOANM07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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