BibTeX record conf/isqed/SultanFSvMPHCKCMTCHKAGHWBBIA09

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@inproceedings{DBLP:conf/isqed/SultanFSvMPHCKCMTCHKAGHWBBIA09,
  author       = {Akif Sultan and
                  John Faricelli and
                  Sushant Suryagandh and
                  Hans vanMeer and
                  Kaveri Mathur and
                  James Pattison and
                  Sean Hannon and
                  Greg Constant and
                  Kalyana Kumar and
                  Kevin Carrejo and
                  Joe Meier and
                  Rasit Onur Topaloglu and
                  Darin Chan and
                  Uwe Hahn and
                  Thorsten Knopp and
                  Victor Andrade and
                  Bill Gardiol and
                  Steve Hejl and
                  David Wu and
                  James Buller and
                  Larry Bair and
                  Ali Icel and
                  Yuri Apanovich},
  title        = {{CAD} utilities to comprehend layout-dependent stress effects in 45
                  nm high- performance {SOI} custom macro design},
  booktitle    = {10th International Symposium on Quality of Electronic Design {(ISQED}
                  2009), 16-18 March 2009, San Jose, CA, {USA}},
  pages        = {442--446},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/ISQED.2009.4810335},
  doi          = {10.1109/ISQED.2009.4810335},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/SultanFSvMPHCKCMTCHKAGHWBBIA09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}