BibTeX record conf/isqed/VenkatramanCR06

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@inproceedings{DBLP:conf/isqed/VenkatramanCR06,
  author       = {R. Venkatraman and
                  R. Castagnetti and
                  S. Ramesh},
  title        = {The Statistics of Device Variations and its Impact on {SRAM} Bitcell
                  Performance, Leakage and Stability},
  booktitle    = {7th International Symposium on Quality of Electronic Design {(ISQED}
                  2006), 27-29 March 2006, San Jose, CA, {USA}},
  pages        = {190--195},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ISQED.2006.134},
  doi          = {10.1109/ISQED.2006.134},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/VenkatramanCR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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