BibTeX record conf/isscc/SinghFWHFBS10

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@inproceedings{DBLP:conf/isscc/SinghFWHFBS10,
  author       = {Prashant Singh and
                  Zhiyoong Foo and
                  Michael Wieckowski and
                  Scott Hanson and
                  Matthew Fojtik and
                  David T. Blaauw and
                  Dennis Sylvester},
  title        = {Early detection of oxide breakdown through in situ degradation sensing},
  booktitle    = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2010,
                  Digest of Technical Papers, San Francisco, CA, USA, 7-11 February,
                  2010},
  pages        = {190--191},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/ISSCC.2010.5433990},
  doi          = {10.1109/ISSCC.2010.5433990},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/SinghFWHFBS10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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